{"version":"1.0","provider_name":"IREC","provider_url":"https:\/\/www.irec.cat\/es","author_name":"IREC","author_url":"https:\/\/www.irec.cat\/es","title":"IREC | Advanced characterization of semiconductor materials and quality control methodologies for monitoring of the manufacturing of high-tech photovoltaic devices- RyC2022 (Maxim Guc)","type":"rich","width":600,"height":338,"html":"<blockquote class=\"wp-embedded-content\" data-secret=\"LzXBvr7ytE\"><a href=\"https:\/\/www.irec.cat\/es\/research\/projects\/ryc2022-maxim-guc\">Advanced characterization of semiconductor materials and quality control methodologies for monitoring of the manufacturing of high-tech photovoltaic devices- RyC2022 (Maxim Guc)<\/a><\/blockquote><iframe sandbox=\"allow-scripts\" security=\"restricted\" src=\"https:\/\/www.irec.cat\/es\/research\/projects\/ryc2022-maxim-guc\/embed#?secret=LzXBvr7ytE\" width=\"600\" height=\"338\" title=\"\u00abAdvanced characterization of semiconductor materials and quality control methodologies for monitoring of the manufacturing of high-tech photovoltaic devices- RyC2022 (Maxim Guc)\u00bb \u2014 IREC\" data-secret=\"LzXBvr7ytE\" frameborder=\"0\" marginwidth=\"0\" marginheight=\"0\" scrolling=\"no\" class=\"wp-embedded-content\"><\/iframe><script>\n\/*! This file is auto-generated *\/\n!function(d,l){\"use strict\";l.querySelector&&d.addEventListener&&\"undefined\"!=typeof URL&&(d.wp=d.wp||{},d.wp.receiveEmbedMessage||(d.wp.receiveEmbedMessage=function(e){var t=e.data;if((t||t.secret||t.message||t.value)&&!\/[^a-zA-Z0-9]\/.test(t.secret)){for(var s,r,n,a=l.querySelectorAll('iframe[data-secret=\"'+t.secret+'\"]'),o=l.querySelectorAll('blockquote[data-secret=\"'+t.secret+'\"]'),c=new RegExp(\"^https?:$\",\"i\"),i=0;i<o.length;i++)o[i].style.display=\"none\";for(i=0;i<a.length;i++)s=a[i],e.source===s.contentWindow&&(s.removeAttribute(\"style\"),\"height\"===t.message?(1e3<(r=parseInt(t.value,10))?r=1e3:~~r<200&&(r=200),s.height=r):\"link\"===t.message&&(r=new URL(s.getAttribute(\"src\")),n=new URL(t.value),c.test(n.protocol))&&n.host===r.host&&l.activeElement===s&&(d.top.location.href=t.value))}},d.addEventListener(\"message\",d.wp.receiveEmbedMessage,!1),l.addEventListener(\"DOMContentLoaded\",function(){for(var e,t,s=l.querySelectorAll(\"iframe.wp-embedded-content\"),r=0;r<s.length;r++)(t=(e=s[r]).getAttribute(\"data-secret\"))||(t=Math.random().toString(36).substring(2,12),e.src+=\"#?secret=\"+t,e.setAttribute(\"data-secret\",t)),e.contentWindow.postMessage({message:\"ready\",secret:t},\"*\")},!1)))}(window,document);\n\/\/# sourceURL=https:\/\/www.irec.cat\/wp-includes\/js\/wp-embed.min.js\n<\/script>\n","description":"The principal research interests of Maxim Guc are centered on two key topics. The first one is devoted to the fundamental characterization of semiconductor materials and optoelectronic devices, mainly in photovoltaics (PV). His involvement in this research topic continues since the preparation of his Master thesis, and is based on the deep analysis of fundamental&hellip;&nbsp;","thumbnail_url":"https:\/\/www.irec.cat\/\/wp-content\/uploads\/2021\/09\/Micinn-PNG.png"}