Developing Raman scattering as quality control technique: Correlation with presence of electronic defects in CIGS-based devices

Ruiz, C.M.;Fontane, X.; Fairbrother, A.; Izquierdo-Roca, V.; Broussillou, C.; Bodnar, S.; Perez-Rodriguez, A.; Bermudez, V. "Developing Raman scattering as quality control technique: Correlation with presence of electronic defects in CIGS-based devices" Conference Record of the IEEE Photovoltaic Specialists Conference pp. 455 - 458. 2012 DOI: 10.1109/PVSC.2012.6317656